Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconst
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Author: Sonia Conesa-Boj, Sonia Estrade, Josep M. Rebled,
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Pages: 31
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A study on advanced techniques in electron microscopy, a study using a type of microscope that uses an electron beam to illuminate a specimen and produce a magnified image, on semiconductor nanowires covering atomic density of states analysis to 3D reconstruction models.
