Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy
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Author: John H. Cantrell, Sean A. Cantrell
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Pages: 31
Published: 11 years agoRating: Rated: 0 times Rate It
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Book Description
A study on Cantilever Tip-Sample Surface using a Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy