Optoelectronic Devices and Properties by Oleg Sergiyenko - HTML preview

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Wi

W th

i

th in

je

in c

je t

c io

t n

io

y (d

-35

y (d

-3

Magnitude S

sit -60

n -6

nte

-45

-4

In -80

-81550

1552

1

1554

155

1556

1558

1

0

5

10

15

1

20

Wa

W v

a e

v le

e n

le g

n th

g (n

th m

(n )

Fr

F e

r quency

e

(

quency G

( H

G z

H )

m)

z

(a)

(a

(b)

Fig. 1.16. (a) Measured optical spectra at the modulation frequency of 10 GHz. The insets

show the higher resolution spectra. (b) Frequency response of the slave laser at different

wavelength detuning, where the injection optical power is 3.6 mW, and the mode spacing

difference is 0.14 GHz

In addition to the above two main factors, the total optical injection power of the master

laser and FP mode numbers can also affect the injection operation efficiency (Zhu et al.,

2008). The optimal wavelength matching is mainly twofold: first, the close central

wavelengths and more FP modes, and second, the mode spacing difference of several

gigahertz.

518

Optoelectronic Devices and Properties

-15

-1

I

=57

= m

57 A

m

Mas

Ma t

s e

t r

e

-5

-35

) -3

)

)

-55

-5

B -15

-1

(d

-75

-7

21

-15

tensity(dBm -1

tensity(dBm

I

=3

= 1.5m

3

A

1.5m

Sla

Sl v

a e

v

-25

-2

Mast

M

er

ast

in

Mas

Ma t

s e

t r

in

e

-35

-3

ude S

Wi

W th

i ou

th

t

ou in

t je

in c

je t

c ion

t

tical

Less ov

Less erl

ov

a

erl p

tical

a

-35

-3

-55

-5

Fu

F l

u l

l ov

l e

ov r

e lap

r

Op

Magnit

-75

-7

-45

-4

1540

1545

1550

1555

1560

1565

1570

1575

0

5

10

15

20

Wav

Wa e

v l

e e

l n

e g

n t

g h

t (

h n

( m

n )

m

Freq

Fre ue

q n

ue c

n y

c (

y G

( Hz)

G

(a)

(b)

(

Fig. 1.17. (a) Measured optical spectra of the master laser biased at 57 and 31.5 mA,

compared with the measured spectrum of the slave laser. (b) Corresponding frequency

responses of the slave laser, where the injection optical power is 3.9 mW, and the mode

spacing difference is 4 GHz

4.2 Frequency-pushing effect in single-mode diode laser subject to external dual-

beam injection

A frequency-pushing effect can occur for semiconductor laser at positive detuning

frequencies and higher injection ratios. The degree of pushing increases as the detuning

frequency of the injection ratio increases or the external signal decreases (Simpson et al.,

1997). Frequency convertor based on nearly degenerate four-wave mixing (NDFWM) in

injection-locked semiconductor laser has been demonstrated for frequency conversion in

optical communication systems, where two injection lasers are used. NDFWM in an

injection-locked semiconductor laser has been studied in detail by Li and Petermann (Li &

Petermann, 1993). The NDFWM pump signal is provided by a semiconductor laser

frequency-locked through optical injection of an external signal, and another external

injection signal acts as the probe signal. Therefore, a conjugate signal is produced in the

NDFWM process.

The influence of the frequency-pushing effect on dual-beam injection system can be

observed intuitively in Fig. 1.18. Fig. 1.18(a) shows the free-running spectrum consisting of a

single peak and weak relaxation resonance sidebands. The negative detuning frequency

between the slave and the injection light (M1) is fixed out of the locking range as shown in

Fig. 1.18(b). Then, another light (M2) is simultaneously injected at positive detuning

frequency. As shown in Fig. 1.18(c), the spectrum consists of a slave signal and two

regenerative amplified injected signals M1 and M2, and their detuning frequencies are both

out of the locking range. For optical injection at positive detuning frequency, M2 pushes the

slave signal to the negative detuning frequency. While the detuning frequency between M2

and the slave decreases, the degree of the frequency-pushing increases. Therefore, at a

critical point, M1 falls into the locking range of the slave laser, i.e. the slave signal is locked

to M1 as shown in Fig. 1.18(d). A converted signal C1 is observed at the red side of M1. As

M2 continuously moves towards M1, the amplitude of C1 increases at first and then

Optical and Electrical Spectrum Analysis of Optoelectronic Devices

519

decreases as shown in Fig. 1.18(d)-(f). This means that the conversion efficiency has

maximum (Li & Petermann, 1993). In Fig. 1.18(g), the slave light jumps nearby of its free-

running frequency when M2 gets close to M1 because M1 and M2 are both out of the locking

range again.

To get a deep insight of this process, we explain it on the viewpoint of medium-gain. Firstly

we consider a single-beam injection system. Since the external injection light enhances the

stimulated emission inside the cavity, the carrier population gets depleted faster, which

results in a reduction of the gain and the carrier density in the laser cavity. This gain

reduction induced by external light injection (blue line) is illustrated in Fig. 1.19 by showing

the gain spectrum and the loss spectrum. Furthermore, this gain reduction through ß (the

linewidth enhancement factor) changes the slave laser cavity frequency. The amount of

cavity resonance shift is: Δλcav ( N)=(λ02/2πc) ßgΔN/2 (Zhao et al., 2006), where g is the differential gain, N is the carrier density and c is the speed of light. Since ΔN is always

negative, the cavity resonance is red-shifted and Δλcav (N) is increased as the injection power

increased.

Under the optical injection at positive detuning frequencies, the cavity resonance shift

exhibits a frequency-pushing effect, which can be related to the medium-gain spectrum of

the slave laser. For an injection wavelength far from the cavity resonance, the medium gain

is small, and the amount of stimulated emission (regenerative amplified master light)

caused by injection light is also small. Thus, the cavity resonance shift as well as the carrier

density reduction is small. The injection light experiences more cavity gain as it getting

closer to the cavity resonance under a fixed injection power, leading to a further reduced

carrier density and a further red-shifted cavity resonance. In this process, the regenerative

amplified master light is amplified by the cavity gain and the cavity resonance mode is

suppressed. Finally, the slave laser gain is smaller than its threshold value, the master laser

compensates this reduction and the slave laser is lasting at the master wavelength when it is

injection locked. This process is illustrated in Fig. 1.19(a)-(d).

For optical injection at negative detuning frequencies (Fig. 1.19(e)), the cavity resonance shift

exhibits a frequency pulling effect towards the injected light. As the frequency detuning

between the maser and slave light is decreased at a critical point (Fig. 1.19(f)), the cavity

resonance shifts automatically and continually to the frequency of the injection light until

injection locking. It can be explained as follows: at the critical point (the margin of the

locking range), the negative detuning injection light pulls the cavity resonance to the red

side by a little amount, thus, the injection light can experience more cavity gain, which

results in a further reducing of the carrier density and a more red-shifted cavity resonance.

The red-shifted cavity resonance makes the injection light experience even more cavity gain.

This process repeats automatically until the slave laser gain is smaller than its threshold

value, leading to injection locking as shown in Fig. 1.19(f)-(h). The physically process in Fig.

1.19 is important in understanding the frequency-pushing effect in dual masters-slave

system.

The gain and optical spectra in Fig. 1.20(a)-(f) correspond to the process in Fig. 1.18(b)-(g).

The slave laser gets sufficient push when M2 moves closer (Fig. 1.20(b)), as explained in Fig.

1.19(a)-(c), and then it falls into the locking range of M1. Thus, the slave light is locked to the

frequency of M1 just like the process illustrated in Fig. 1.19(f)-(h). NDFWM between the

M2and injection-locked slave accounts for the converted signal C1 and C2 as shown in Fig.

1.20(c). When the converted signal C1 coincides with the red-shifted cavity resonance

(amplified spontaneous emission), C1 is amplified by the cavity resonance as shown in Fig.

520

Optoelectronic Devices and Properties

1.20(d). This explains the maximum of conversion efficiency from Fig. 1.18(d) to Fig. 1.18(f).

In Fig. 1.20(f), the injection signals are out of the locking range of the slave laser. The

interaction between the injected lights and the slave gain is very weak. Thus, the slave laser

is lasing near its free-running frequency.

-20 (a)

free-running slave

-40

-60

-80

-20

slave

M1

(b)

-40

-60

-80

-20

M2

slave

(c)

M1

-40

-60

-80

(dBm)

-20

locking to M1

(d)

M2

tra -40

ec

C1

-60

-80

al sp

-20 (e)

M2

locking to M1

Optic -40

C1

C2

-60

-80

-20

(f)

M2

locking to M1

-40

C1

-60

C2

-80

-20

slave

M2

M1

(g)

-40

-60

-80

1546.0

1546.2

1546.4

1546.6

1546.8

1547.0

1547.2

Wavelength (nm)

Fig. 1.18. Measured optical spectra in the process: M2 moves towards the slave signal from

positive detuning frequency with a fixed optical power (-15.37 dB) while M1 is fixed at an

operating point (-13.73 dB, -12.59 GHz)

The further influence of the frequency-pushing effect on dual-beam injection system is

shown in Fig. 1.21(a). Firstly, the conventional stable locking diagram is generated in a

single master-beam injection system. The locking boundary is marked by open circles and

dashed curve as shown in Fig. 1.21(a). Next, another injection signal from M2 injects

simultaneously at a fixed operating point (-10.12 dB, 12.08 GHz). A pushed locking range is

observed in this case due to the frequency-pushing effect, whose boundary is indicated by

Optical and Electrical Spectrum Analysis of Optoelectronic Devices

521

red open triangles and dashed curve. The direction of pushing is indicated by a blue arrow,

i.e. towards negative detuning frequency and low injection ratio. This is mainly because the

injection of M2 pushes the slave frequency to the negative detuning frequency and

suppresses its optical power by decreasing the slave gain.

Positive

v detuning

Ne

N ga

e

ti

t ve

v de

e

tu

de ning

Gain

Ga Sp

in

ec

Sp t

ec r

t a

Opti

p cal Sp

l S ec

p tra

r

Gai

Ga n Sp

n

ec

Sp t

ec ra

Opti

Op ca

c l Spec

l Spe tra

r

(a)

Stimul

St

at

imul e

at d

(e)

Gain

Emissio

Emis

n

sio

(cav

(

ity

cav

f

ity r

f equen

r

c

equen y)

y

Am

A plifi

p

e

lifi d

Inje

j ctio

t n

Spon

Spo ta

t neous

Loss

neou

s

Light

Emissio

Emis

n

sio

(fixed power)

(b)

(f)

(f

Master

Mast

Sla

Sl ve

v

(c)

(g)

(g

<10 ns

<

Ampl

p if

i ied

(d)

(d

(h)

Spontaneous

Emissio

Emis

n

sio

(cav

(

ity

cav

f

ity r

f eque

equ nc

n y)

Locking

y)

Lo

L cking

Wave

Wav l

e ength

ngt

Fig. 1.19. Schematic showing the processes of frequency pushing and injection locking by

medium-gain and optical spectra changing at positive and negative detuning frequencies

with a fixed injection power in single-beam injection system

Fig. 1.21(b) gives the locking bandwidth as a function of power injection ratio under single-

beam injection (curve a) and dual-beam injection (curve b). It is obvious that the locking

bandwidth varies with the power injection ratio. The variation of the locking bandwidth

before and after injecting another beam is also shown in Fig. 1.21(b) (curve c= curve b-curve

a). The horizontal dashed grey line as a reference indicates the identical locking bandwidths

before and after injecting another beam. Under dual-beam injection, it can be seen that the

frequency-pushing effect results in an increased locking bandwidth at most injection ratios